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T85.110

ICD-10-CM 2027

Breakdown (mechanical) of implanted electronic neurostimulator of brain electrode (lead)

Untergeordnete Codes

  • T85.110A – Breakdown (mechanical) of implanted electronic neurostimulator of brain electrode (lead), initial encounter
  • T85.110D – Breakdown (mechanical) of implanted electronic neurostimulator of brain electrode (lead), subsequent encounter
  • T85.110S – Breakdown (mechanical) of implanted electronic neurostimulator of brain electrode (lead), sequela

Geschwistercodes

  • T85.111 – Breakdown (mechanical) of implanted electronic neurostimulator of peripheral nerve electrode (lead)
  • T85.112 – Breakdown (mechanical) of implanted electronic neurostimulator of spinal cord electrode (lead)
  • T85.113 – Breakdown (mechanical) of implanted electronic neurostimulator, generator
  • T85.118 – Breakdown (mechanical) of other implanted electronic stimulator of nervous system

Vererbt von T85: Complications of other internal prosthetic devices, implants and grafts

7th character

  • A = initial encounter
  • D = subsequent encounter
  • S = sequela

7th character note

  • The appropriate 7th character is to be added to each code from category T85

Excludes2

  • failure and rejection of transplanted organs and tissue (T86.-)

Teil von: T85.11: Breakdown (mechanical) of implanted electronic stimulator of nervous system › T85.1: Mechanical complication of implanted electronic stimulator of nervous system › T85: Complications of other internal prosthetic devices, implants and grafts