XE2ZRICD-11 MMS 2026-01
Testing of device from other lot batch retained by manufacturer
Description
The investigation employed relevant empirical testing of the device of another lot or batch than that of the suspected device in the reported adverse event in order to support the identification of possible causes for the adverse event. This includes devices without a lot/batch designation. Testing was performed using the device retained by the manufacturer (i.e. was not shipped). Relevant testing would typically be based on test methods used for evaluating safety and performance as described in the latest relevant standards.
Index terms
- Testing of device from other lot batch retained by manufacturer
Sibling codes
XE18W– Device discardedXE1XT– Testing of model variantXE3TW– Insufficient information availableXE4KV– Analysis of production recordsXE4S0– Testing of device from same lot batch returned from userXE4X1– Testing of device from other lot or batch returned from userXE53L– Device not accessible for testingXE59M– Analysis of data provided by user or third partyXE5AN– Incomplete device returnedXE6FS– Testing of patient sample or reference material using manufacturer's deviceXE6Q2– Type of investigation not yet determinedXE7GK– Communication or interviewsXE7XH– Testing of device from same lot or batch retained by manufacturerXE89L– Testing of patient sample or reference material using competitor's deviceXE8BM– Trend analysisXE8FB– Device not manufactured by reporting manufacturerXE8UH– Historical data analysisXE8XV– Testing of raw or starting materialsXE970– Device not returnedXE9HD– Testing of actual or suspected deviceXE9MY– Testing of patient sample or reference material using reference method
Foundation entity
Testing of device from other lot batch retained by manufacturer – http://id.who.int/icd/entity/1601225299
Part of: X: Extension Codes