XE8BMICD-11 MMS 2026-01
Trend analysis
Description
The investigation involved trend analysis of adverse event of the actual device involved in the adverse event and/or of products from the same and/or different batches/lots. It should be noted that trend analysis typically is not considered sufficient as a stand-alone method, but should be used in conjunction with other investigation methods for providing for instance complementary information.
Index terms
- Trend analysis
Sibling codes
XE18W– Device discardedXE1XT– Testing of model variantXE2ZR– Testing of device from other lot batch retained by manufacturerXE3TW– Insufficient information availableXE4KV– Analysis of production recordsXE4S0– Testing of device from same lot batch returned from userXE4X1– Testing of device from other lot or batch returned from userXE53L– Device not accessible for testingXE59M– Analysis of data provided by user or third partyXE5AN– Incomplete device returnedXE6FS– Testing of patient sample or reference material using manufacturer's deviceXE6Q2– Type of investigation not yet determinedXE7GK– Communication or interviewsXE7XH– Testing of device from same lot or batch retained by manufacturerXE89L– Testing of patient sample or reference material using competitor's deviceXE8FB– Device not manufactured by reporting manufacturerXE8UH– Historical data analysisXE8XV– Testing of raw or starting materialsXE970– Device not returnedXE9HD– Testing of actual or suspected deviceXE9MY– Testing of patient sample or reference material using reference method
Foundation entity
Part of: X: Extension Codes