Historical data analysis

Sibling codes

• XE18W – Device discarded
• XE1XT – Testing of model variant
• XE2ZR – Testing of device from other lot batch retained by manufacturer
• XE3TW – Insufficient information available
• XE4KV – Analysis of production records
• XE4S0 – Testing of device from same lot batch returned from user
• XE4X1 – Testing of device from other lot or batch returned from user
• XE53L – Device not accessible for testing
• XE59M – Analysis of data provided by user or third party
• XE5AN – Incomplete device returned
• XE6FS – Testing of patient sample or reference material using manufacturer's device
• XE6Q2 – Type of investigation not yet determined
• XE7GK – Communication or interviews
• XE7XH – Testing of device from same lot or batch retained by manufacturer
• XE89L – Testing of patient sample or reference material using competitor's device
• XE8BM – Trend analysis
• XE8FB – Device not manufactured by reporting manufacturer
• XE8XV – Testing of raw or starting materials
• XE970 – Device not returned
• XE9HD – Testing of actual or suspected device
• XE9MY – Testing of patient sample or reference material using reference method

Foundation entity

Historical data analysis – http://id.who.int/icd/entity/1315006457